Info

JEOL JSM-7500F

Japan JEOL JSM-7500F
1. Accelerating voltage: 0.3 - 30 kV 
2. Lamp silk: W(310) cold field emission 
3. Resolving power: 1.0 nm 
4. Magnification: 25 – 1,000,000 
5. Image capture: CCD-Camera 
6. EDS (OXFORD INCA X-ACT)
7. Deben Centaurus Backscatter Detector. 

Charging method
JEOL JSM-7500F
Fee Items                                       CGU Labs       /     Non CGU Labs 
Unused EDS                              800 NT (hour)    /     1600 NT (hour)
Use EDS                                   1000 NT (hour)    /     2000 NT (hour) 

Specimen Preparation Requirements:

  1. Please place the sample on an aluminum stub with a diameter of 26 mm.
  2. To maintain vacuum integrity, the sample must not decompose, release gas, or become liquid under electron beam exposure.
  3. To prevent damage, this instrument will not accept powder samples or materials that are strongly magnetic, magnetic (e.g., iron, cobalt, nickel), or easily attracted by the electromagnetic lens.
  4. To avoid damage, this instrument will not accept samples that are toxic, corrosive, volatile, or have a low melting point.
  5. To prevent computer contamination, please use a CD for burning electronic files.